主要规格及技术指标

"●Theta/theta vertical goniometer
●2Theta angle range: -110~168°
●Angle accuracy: 0.0001 degree
●Cr/Co/Cu target, standard size light pipe
●Detector: Links Array Detector, Links XE Array Detector
●Instrument size: 1868x1300x1135mm
●Weight: 770kg
●Theta/theta 立式测角仪
●2Theta角度范围：-110~168°
●角度精度：0.0001度
●Cr/Co/Cu靶，标准尺寸光管
●探测器：林克斯阵列探测器、林克斯XE阵列探测器
●仪器尺寸：1868x1300x1135mm
●重量：770kg "

主要功能及特色

The brand-new D8 ADVANCE X-ray diffractometer of Bruker AXS adopts the creative Da Vinci design. Through the TWIN-TWIN optical path design, it has successfully realized the qualitative and quantitative analysis under the BB focusing geometry and the glancing incidence GID analysis of the film under the parallel light geometry Fully automatic switching of XRR analysis of film reflectance without the need for light. Through TWIST TUBE technology, users can switch from line light source applications (qualitative and quantitative analysis of conventional powder, GID, XRR of films) to point light source applications (texture, stress, micro area) within 1 minute, which is annoying Issues such as light path interchange and re-alignment have become history!
The high-precision goniometer can ensure that the error between the measured peak position and the standard peak position of each diffraction peak (note that it is not a diffraction peak) in the full spectrum range does not exceed 0.01 degrees. Bruker AXS provides a global guarantee!
The advanced Links array detector can increase the intensity by 150 times, which not only improves the efficiency of the equipment, but also greatly improves the detection sensitivity of the equipment.
application:
●Phase qualitative analysis
●Analysis of crystallinity and amorphous phase content
●Structural refinement and analysis
●Phase quantitative analysis
●Accurate measurement of lattice parameters
●No standard sample quantitative analysis
●Micro strain analysis
●Analysis of grain size
●In-situ analysis
●Residual stress
●Low angle mesoporous material measurement
●Texture and ODF analysis
●Glassing incidence of thin film
●Film reflectivity measurement
●Small angle scattering布鲁克AXS公司全新的D8 ADVANCE X射线衍射仪，采用创造性的达芬奇设计，通过TWIN-TWIN光路设计，成功实现了BB聚焦几何下的定性定量分析和平行光几何下的薄膜掠入射GID分析、薄膜反射率XRR分析的全自动切换，而无需对光。通过TWIST TUBE技术，使用户可以在1分钟内完成从线光源应用（常规粉末的定性定量分析、薄膜的GID、XRR）到点光源应用（织构、应力、微区）的切换，让烦人的光路互换、重新对光等问题从此成为历史！
高精度的测角仪可以保证在全谱范围内的每一个衍射峰（注意不是一个衍射峰）的测量峰位和标准峰位的误差不超过0.01度，布鲁克AXS公司提供全球保证！
先进的林克斯阵列探测器可以提高强度150倍，不仅答复提高设备的使用效率， 而且大幅提高了设备的探测灵敏度。
应用:
●物相定性分析
●结晶度及非晶相含量分析
●结构精修及解析
●物相定量分析
●点阵参数精确测量
●无标样定量分析
●微观应变分析
●晶粒尺寸分析
●原位分析
●残余应力
●低角度介孔材料测量
●织构及ODF分析
●薄膜掠入射
●薄膜反射率测量
●小角散射

主要附件及配置

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