仪器分类
Semiconductor Analyzer_半导体测试仪
Semiconductor Analyzer_半导体测试仪
仪器编号
54879
SN序列号
MY54010145
生产厂家
Keysight_是德科技
型号
B1505A
制造国家
United States_美国
分类号
03190402
放置地点
Public BuildingP016
购置日期
2018-12-31
入网日期
2020-12-05

主要规格及技术指标

"Precision measurement across a wide range of operating conditions
All-in-one solution for power device characterization up to 1500 A & 10 kV
Medium current measurement with high voltage bias (e.g. 500 mA at 1200 V)
μΩ on-resistance measurement capability
Accurate, sub-picoamp level, current measurement at high voltage bias
Fully automated thermal testing from -50 ℃ to +250 ℃

Extensive device evaluation capabilities
Fully automated Capacitance (Ciss, Coss, Crss, etc.) measurement at up to 3000 V of DC bias
High power pulsed measurements down to 10 μs
Both packaged device and on-wafer IGBT/FET gate charge measurement
High voltage/high current fast switch option to characterize GaN current collapse effect
Up to five high voltage (3 kV) source/measure channels for maximum flexibility
Safe temperature dependent testing via an interlock-equipped test fixture

Improved measurement efficiency
Switch between high-voltage and high-current measurements without the need to recable
Automatic test circuit formation for transistor junction capacitances (Ciss, Coss, Crss, Cgs, Cgd, Cds, etc.) for both packaged and on-wafer devices
Standard test fixtures with interlock for safe packaged power device testing
Supported and secure on-wafer high-power testing over 200 A and up to 10 kV
Oscilloscope view allows verification of applied voltage and current waveforms
MS Windows-based EasyEXPERT software facilitates data management and analysis

Upgradable and scalable hardware architecture
A wide selection of measurement modules
Support for high power devices with up to 6 pins

广泛的工作条件与精密测量功能相结合
适合功率器件表征的综合解决方案,高达 1500 A 和 10 kV
中等电流测量和高电压偏置(例如,500 mA,1200 V)
μΩ 导通电阻测量功能
高电压偏置时,可进行精确的 sub-pA 电平电流测量
在 -50 ℃ 至 +250 ℃ 温度范围内进行全自动热测试

广泛的器件测量功能
可在高达 3000 V 直流偏置时执行全自动电容测量(Ciss、Coss、Crss 等)
10 μs 高功率脉冲测量
封装器件和晶圆上 IGBT/FET 栅极电荷测量
高电压/强电流快速切换选件,适用于 GaN 电流崩塌效应表征
多达 5 个高电压(3 kV)电源/测量通道,提供最大的灵活性
通过互锁测试夹具执行安全的与温度相关的测试

改进的测量效率
在高电压和强电流测量之间自动切换,无需重新布线
自动测试电路形成,可用于封装器件和晶圆上器件的晶体管结电容(Ciss、Coss、Crss、Cgs、Cgd、Cds 等)测量
具有互锁机制的标准测试夹具,可进行封装功率器件测试
支持高达 200 A 和 10 kV 的高功率晶圆上测试
示波器视图支持对应用电压和电流波形的验证
MS Windows EasyEXPERT 软件简化了数据管理和分析流程

可升级和可扩展的硬件体系结构
广泛的测量模块选择
支持具有高达 6 个连接引脚的高功率器件"

主要功能及特色

The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz – 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
The B1505A software environment is based on Microsoft® Windows® 10 operating system and allows users to check device characteristics and detect device faults with the convenience of a curve tracer. Just like a conventional curve tracer the B1505A supports rotary knob control variable sweep capabilities. This allows real-time evaluation of parameters such as breakdown voltage. Also supported is “Oscilloscope View” that visually assists the operator in optimizing voltage and current being applied to the device. The measurement setup information and data are automatically stored to the B1505A's built-in hard disk drive. They may also be copied to USB memory sticks and other portable storage devices. Measurement data may be easily copied into engineering reports with the device measurement summary.

Keysight B1505A 功率器件分析仪/曲线追踪仪是唯一能够对 sub-pA 电平至 10 kV 和 1500 A 的高功率器件进行表征的综合解决方案。这些功能能够对最新的器件(例如 IGBT)和材料(例如 GaN 和 SiC)进行测量。B1505A 支持各种模块:高电压 SMU(HVSMU)、强电流 SMU(HCSMU)、超强电流(UHC)模块、超高电压(UHV)模块和高电压中等电流(HVMC)模块。B1505A 还支持:高功率 SMU(1 A/200 V)、中等功率 SMU(100 mA/100 V)、中等电流 SMU(1 A/30V 脉冲,100 mA/30V 直流)和多频电容测量单元(1 kHz-5 MHz)。B1505A 的 10 插槽模块化主机支持您对其进行配置,以满足您的测量需求。

B1505A 软件环境以 Microsoft® Windows® 10 操作系统为基础,包括曲线追踪仪,支持用户检测器件特征和探测器件故障。如同使用曲线追踪仪一样,B1505A 提供旋钮控制可变扫描功能,可对参数(例如击穿电压)进行实时测量。B1505A 还提供“示波器查看功能”,可直观地帮助操作人员优化应用于器件的电压和电流。测量设置信息和数据可自动存储到 B1505A 的内置硬盘,并复制到 USB 闪存和其他便携存储器件。将器件测量结果汇总之后,测量数据可轻松复制到工程报告中。

主要附件及配置

公告名称 公告内容 发布日期