主要规格及技术指标

GP200 has a stable and reliable testing platform to ensure the quality of needle insertion during testing. Excellent optical system combined with resolution<2 μ The needle holder system of m ensures the stability of the needle insertion. In DC applications, the high-quality cables and three-axis signal path of GP200 can enable DUT characteristic analysis to reach fA level; In RF applications, by shortening the distance between the spreading module and the probe connector, it is possible to efficiently and better extract high-quality parameters of THz internal devices.

Capable of detecting multi frequency AC capacitance measurements within the range of 1 kHz to 5 MHz
Equipped with an intuitive 15 inch touchscreen interface, data analysis can be performed without the need for an external computer
Up to 10 slots in a B1500A host

GP200拥有稳定且可靠的测试平台，保证测试中的扎针质量。优异的光学系统结合分辨率＜2μm的针座系统，确保扎针的稳定性。在直流应用中，GP200高品质的电缆和三轴信号通路，可使DUT特性分析达到fA级别；射频应用中，通过缩短扩频模块与探针之间连接器的距离，可高效且更好地实现THz内器件高品质参数的提取。
能够检测 1 kHz 至 5 MHz 范围内的多频交流电容测量值
配有直观的 15 英寸触摸屏界面，无需借助外部计算机，即可进行数据分析
一台 B1500A 主机中拥有多达 10 个插槽

主要功能及特色

The GP200 includes the complete configuration required for DC~THZ testing, enabling accurate completion of testing requirements in the shortest possible time. Provide professional testing solutions that can achieve high-quality I-V, C-V, RF and other tests.

Keysight B1500A semiconductor parameter analyzer is an integrated device characterization analyzer that can measure parameters such as IV, CV, pulse/dynamic IV. The host and plug-in modules can characterize most electronic devices, materials, semiconductors, and active/passive components. The B1500A modular architecture can be flexibly upgraded as needed.

GP200包含DC~THZ测试所需的完整配置，能够在最短时间内准确地完成测试要求。提供专业的测试方案，能够实现高品质的I-V、C-V、RF 等测试。

Keysight B1500A 半导体参数分析仪是一款一体化器件表征分析仪，能够测量 IV、CV、脉冲/动态 IV 等参数。 主机和插入式模块能够表征大多数电子器件、材料、半导体和有源/无源元器件。 B1500A 模块化体系结构可以根据需要灵活升级。

主要附件及配置

1、 Test system probe station section
2、 Testing System Instrument B1500A Section
一、测试系统探针台部分
二、测试系统仪表B1500A部分