仪器分类
Array test system for advanced semiconductor materials_先进半导体材料阵列测试系统
Array test system for advanced semiconductor materials_先进半导体材料阵列测试系统
仪器编号
2024102101931
SN序列号
生产厂家
上海众执芯信息科技有限公司
型号
ZX-ArrayTester-24S ZX-Array-Chassis
制造国家
中国
分类号
放置地点
Public BuildingP016
购置日期
2024-10-21
入网日期
2025-01-14

主要规格及技术指标

ZX-Array-Chassis设备参数:

2.8 GHz四核PXI控制器;
包含两个10/100/1000BASE-TX(千兆)以太网端口、两个USB 3.0端口、四个USB 2.0端口,以及集成的硬盘驱动器;
9个工艺插槽。

ZXArrayTester-24S设备规格:

SMU4163:配备24个源测量通道,电流分辨率为10pA。
低泄漏电缆:SHDB-62M-62M。
测试电压和电流参数覆盖范围:详见附件。

ZX-Array-Chassis Equipment Parameters:

2.8 GHz quad-core PXI controller;
Includes two 10/100/1000BASE-TX (Gigabit) Ethernet ports, two USB 3.0 ports, four USB 2.0 ports, and an integrated hard drive;
9 process slots.

ZXArrayTester-24S Equipment Specifications:

SMU4163: Equipped with 24 source-measure channels, with a current resolution of 10pA.
Low-leakage Cables: SHDB-62M-62M.
Coverage Range for Test Voltage and Current Parameters: See attached document for details.

主要功能及特色

该系统主要包括:半导体阵列材料制备系统-ZX-Array-Chassis 及半导体集成阵列评估测试系统: ZXArrayTester-24S。

ZX-Array-Chassis设备主要用于实现阵列化芯片开发以及成片效果评估,整体采用机箱可扩展架构,包含材料控制器和工艺设备槽位机架。 ZX-ArrayTester-24S系统旨在执行基于阵列的晶体管电特性测试及数据采集。它能够通过多个输入和输出通道对电路进行分析。

The system mainly comprises: the Semiconductor Array Material Preparation System - ZX-Array-Chassis, and the Semiconductor Integrated Array Evaluation and Testing System: ZXArrayTester-24S.

The ZX-Array-Chassis equipment is primarily used for the development of arrayed chips and the evaluation of their monolithic performance. It adopts an expandable chassis architecture overall, incorporating a material controller and process equipment slot racks. The ZXArrayTester-24S system is designed to perform array-based transistor electrical characteristic tests and data collection. It is capable of analyzing circuits through multiple input and output channels.

对阵列芯片的应用测试方案:
忆阻器阵列应用系统包含:
• 数据采集输入:图像传感器如摄像头输入;训练测试图像数据文件;感知光电系统
• 数据预处理:对输入图像数据进行像素提取并且矩阵划分;去均值,归一化,白化,池化等
• DAC:对输入数据进行数模转化,转成电压输入
• ADC:通过调理电路经过ADC,获取数字转换数据
• 数据处理:对输出数据进行归类统计
• 数据判断:对输入的数据进行识别判断

Application Testing Scheme for Array Chips:
The Memristor Array Application System Includes:
• Data Acquisition Input
Image sensor inputs, such as cameras
Training and testing image data files
Optoelectronic sensing systems
• Data Preprocessing
Pixel extraction and matrix division of input image data
Mean removal, normalization, whitening, pooling, etc.
• DAC (Digital-to-Analog Converter)
Conversion of input data from digital to analog, resulting in voltage inputs
• ADC (Analog-to-Digital Converter)
Acquisition of digitally converted data through conditioning circuits via ADC
• Data Processing
Categorical statistics on output data
• Data Judgment
Recognition and judgment of input data

主要附件及配置

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