仪器分类
Probe Tester Of Semiconductor Analyser System_测试系统探针台
Probe Tester Of Semiconductor Analyser System_测试系统探针台
仪器编号
82804
SN序列号
生产厂家
深圳市易捷测试技术有限公司
型号
GP200
制造国家
中国
分类号
放置地点
TC-C buildingC-2001
购置日期
2023-07-01
入网日期
2025-02-24

主要规格及技术指标

1.XY行程 快速定位行程:210mm×210mm; 精调行程:210mm×210mm ,
2.精调分辨率:≤ 1.0 μm;驱动方式:手动
3.Z轴行程 10mm;驱动方式:手动
4.Theta旋转 快速旋转角度:360°;精调角度:±15°,精调分辨率:<0.02°;驱动方式:手动
5.Chuck台 尺寸:203mm(8inch) ;真空盘可调节高度:±5mm
6.真空快速切换开关,真空调节档位:Center、2’、4’、8’ 安装方式:真空盘与主体绝缘
7.台面精度 平面度:<10 μm
8.快速拉出结构 行程:100mm

1.XY stroke Quick positioning stroke: 210mm×210mm; Fine adjustment stroke: 210mm×210mm.
2. Fine adjustment resolution: ≤ 1.0 μm; drive mode: manual
3.Z-axis travel 10mm; drive mode: manual
4. Theta rotation Rapid rotation angle: 360 °; fine-tuning angle: ± 15 °, fine-tuning resolution: < 0.02 °; drive mode: manual
5. Chuck table size: 203mm (8inch); vacuum disk adjustable height: ± 5mm
6. Vacuum quick switch, vacuum adjustment gear: Center, 2', 4', 8' installation mode: vacuum disk and body insulation
7. Table precision Flatness: <10 μm
8.Quick pull-out structure Stroke: 100mm

主要功能及特色

1.GP200包含DC~THZ测试所需的完整配置,能够在最短时间内准确地完成测试要求。提供专业的测试方案,能够实现高品质的I-V、C-V、RF 等测试。
2.GP200拥有稳定且可靠的测试平台,保证测试中的扎针质量。优异的光学系统结合分辨率<1μm的针座系统,确保扎针的稳定性。在直流应用中,GP200高品质的电缆和三轴信号通路,可使DUT特性分析达到fA级别;射频应用中,通过缩短扩频模块与探针之间连接器的距离,可高效且更好地实现THz内器件高品质参数的提取。优益的三轴低漏点载物台的选件,能够给器件测试带来更多的信心。载物台的单手快速移动及升降、一体化真空开关等优化设计使操作流程更加简洁,不管是初学者还是经验者,使用起来都非常方便、易懂。专门为升级和扩展所设计的各种选项,可轻松实现如负载牵引系统、太赫兹系统、辐照系统、1/f噪声等系统的搭载,GP200系统也可根据您的未来项目需求进行重新配置。

1.GP200 contains the complete configuration required for DC~THZ testing, which can accurately fulfill the testing requirements in the shortest time. It provides professional test solutions that can realize high-quality I-V, C-V, RF and other tests.
2.GP200 has a stable and reliable test platform to ensure the quality of pinning during the test. The excellent optical system combined with a <1μm resolution header system ensures the stability of the pin. In DC applications, the GP200's high-quality cables and triaxial signal path enable DUT characterization up to fA level; in RF applications, by shortening the distance between the connector of the spread spectrum module and the probe, the extraction of high-quality parameters of devices in THz can be efficiently and better realized. The optional 3-axis low leakage stage brings more confidence to device testing. The optimized design of the carrier stage with quick one-handed movement and lifting, and the integrated vacuum switch make the operation flow more concise and easy to use and understand for both beginners and experienced users. A variety of options designed specifically for upgrades and expansions make it easy to piggyback on systems such as load traction systems, terahertz systems, irradiation systems, 1/f noise, etc. The GP200 system can also be reconfigured to meet your future project needs.

主要附件及配置

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