主要规格及技术指标

D8 VENTURE-单晶X射线衍射仪的主要技术参数：
光源：Mo/Cu光源
光源增益：450电子/X射线光子
探测器：CMOS，1024×1024面阵
耦合比：1:1
探测器面积：100 mm×100 mm
探测器阱深：5,000,000 e
测角仪：Kappa四轴
视频显微镜：放大倍数30～110倍，分辨率3微米
The main technical specifications of the D8 VENTURE - Single Crystal X-ray Diffractometer include:
Light Source: Mo/Cu targets
Light Source Gain: 450 electrons per X-ray photon
Detector: CMOS, 1024×1024 pixel array
Coupling Ratio: 1:1
Detector Area: 100 mm × 100 mm
Detector Well Depth: 5,000,000 electrons
Goniometer: Kappa four-circle
Video Microscope: Magnification range from 30x to 110x, with a resolution of 3 microns

主要功能及特色

D8 VENTURE-单晶X射线衍射仪通过X射线辐射单晶样品，利用电磁波与围绕原子的电子相互作用产生的衍射图案来进行分析。由于晶体内部的电子密度确定了这些衍射图案的花样，因此可以通过分析实验得到的衍射花样，计算分子中各个原子的准确位置坐标，以及原子之间的键长、键角、扭曲角、氢键、构型、构象、原子间的非键距离、原子的热振动情况等，从而得出晶体的立体结构。
主要特点
高质量光源：提供高强度的X射线光源，确保实验的准确性和可靠性。
先进探测器：采用二维CMOS面探测器，具有大面积和高分辨率，能够收集到更多的衍射信息。
模块化设计：方便用户根据需要进行配置和升级。
高实验灵活性：提供宽敞的实验空间和方便的样品操作空间，以及样品可视性。
多功能性：可应用于多种材料的结构测定和分析，包括无机物、有机物和金属配合物等。
The D8 VENTURE - Single Crystal X-ray Diffractometer analyzes the diffraction patterns generated by the interaction of X-ray radiation with the electrons surrounding the atoms in a single crystal sample. The diffraction patterns, which are determined by the electron density within the crystal, allow for the precise calculation of the position coordinates of each atom in the molecule, as well as the bond lengths, bond angles, torsion angles, hydrogen bonds, conformations, configurations, non-bonded distances between atoms, and thermal vibrations of atoms. Through this analysis, the three-dimensional structure of the crystal can be deduced.
Main features:
High-quality Light Source: Provides high-intensity X-ray radiation, ensuring the accuracy and reliability of experiments.
Advanced Detector: Equipped with a two-dimensional CMOS area detector featuring a large surface area and high resolution, capable of capturing an abundant amount of diffraction information.
Modular Design: Offers convenience for users to configure and upgrade based on individual needs.
High Experimental Flexibility: Provides ample experimental space and convenient sample manipulation area, along with sample visibility.
Versatility: Applicable to the structural determination and analysis of a wide range of materials, including inorganics, organics, metal complexes, and more.

主要附件及配置

D8 VENTURE-单晶X射线衍射仪由以下主要部分构成：
光源：提供高质量的X射线光源，如Mo/Cu光源。
测角仪：如Kappa四轴测角仪，用于精确控制X射线与样品的角度。
光路系统：确保X射线以正确的路径照射到样品上。
样品台：用于放置和固定待测样品。
探测器：用于收集衍射图案。
低温系统：可选配，用于在低温条件下进行实验。
数据采集系统：收集并处理探测器收集到的数据。
软件： SHELXle，用于数据分析和结构解析。
D8 VENTURE - Single Crystal X-ray Diffractometer is primarily comprised of the following key components:
Light Source: Provides high-quality X-ray radiation, such as Mo/Cu targets.
Goniometer: Employing a Kappa four-circle goniometer, it precisely controls the angle between the X-ray beam and the sample.
Beam Path System: Ensures that the X-rays follow the correct trajectory to illuminate the sample.
Sample Stage: Designed to securely hold and position the sample under investigation.
Detector: Capturing diffraction patterns with high efficiency.
Cryostation: Allows for experiments to be conducted under cryogenic conditions.
Data Acquisition System: Collects and processes the data gathered by the detector.
Software: SHELXle, utilized for data analysis and structural interpretation.
主要附件及配置（Main Accessories and Configurations）
低温系统：牛津Cryostream 800液氮低温系统，X射线光源： Mo/Cu，测角仪 Kappa四轴，探测器
Low-temperature system: Oxford Cryostream 800 liquid nitrogen low-temperature system, X-ray source: Mo/Cu, goniometer Kappa four-axis, detector.